Optimal cutoff points in single and multiple tests for psychological and educational decision making / Ruth Ben-Yashar, Shmuel Nitzan, Hans J. Vos

<http://data.bibliotheken.nl/id/nbt/p239071751>

rdfs:label	"Optimal cutoff points in single and multiple tests for psychological and educational decision making / Ruth Ben-Yashar, Shmuel Nitzan, Hans J. Vos"
schema:name	"Optimal cutoff points in single and multiple tests for psychological and educational decision making"
schema:author	Universiteit Twente (Enschede). Faculteit der Toegepaste Onderwijskunde
	Ben-Yashar, Ruth
schema:contributor	Vos, Hendrik Johan (1951-)
	Nitzan, Shmuel
schema:sameAs	<http://www.worldcat.org/oclc/67016777>
schema:mainEntityOfPage	<https://data.bibliotheken.nl/.well-known/genid/5a2eac0327ba33a098564a507e3ed620>
http://purl.org/dc/terms#issued	"2001"
schema:about	personeelsselectie
	mathematische psychologie
	psychologische tests
schema:inLanguage	"en"
schema:isPartOf	Research report / Division of Educational Measurement and Data Analysis, University of Twente
schema:numberOfPages	31
schema:publication	<https://data.bibliotheken.nl/.well-known/genid/241e6f5ae0027f988f1e7668b4c42349>