Deep-level defects in silicon studied by DLTS and EPR spectroscopy / Pham Nguyen Hai

<http://data.bibliotheken.nl/id/nbt/p157763145>

Proefschrift Universiteit van Amsterdam

rdfs:label	"Deep-level defects in silicon studied by DLTS and EPR spectroscopy / Pham Nguyen Hai"
schema:name	"Deep-level defects in silicon studied by DLTS and EPR spectroscopy"
schema:author	Hai, Pham Nguyen
schema:description	"Proefschrift Universiteit van Amsterdam"
schema:sameAs	<http://www.worldcat.org/oclc/68320553>
schema:mainEntityOfPage	<https://data.bibliotheken.nl/.well-known/genid/40fec08a6062127775630be23eb3809c>
http://purl.org/dc/terms#issued	"1997"
schema:about	Ruimtelading
	Silicon
	Electron paramagnetic resonance
	Lattice defects
	<http://data.bibliotheken.nl/id/thes/p080451578>
	Elektrische eigenschappen
	spectroscopie
	magnetische resonantie
	Spectrometry
	Electron structure
schema:inLanguage	"en"
schema:numberOfPages	110
schema:publication	<https://data.bibliotheken.nl/.well-known/genid/66571184587a96383b7e29e29b390059>