Deep-level defects in silicon studied by DLTS and EPR spectroscopy / Pham Nguyen Hai
type: Book
type: CreativeWork
type: ProductModel
issued: 1997
about: p075663864
about: p078495261
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author: p158957725
description: Proefschrift Universiteit van Amsterdam
language: en
main entity of page: https://data.bibliotheken.nl/.well-known/genid/40fec08a6062127775630be23eb3809c
name: Deep-level defects in silicon studied by DLTS and EPR spectroscopy
number of pages: 110