Local carrier lifetime of non-passivated multi-crystalline silicon wafers measured by the MFCA method / A. Schönecker, J.A. Eikelboom, W.C. Sinke
| rdfs:label | "Local carrier lifetime of non-passivated multi-crystalline silicon wafers measured by the MFCA method / A. Schönecker, J.A. Eikelboom, W.C. Sinke" |
| schema:name | "Local carrier lifetime of non-passivated multi-crystalline silicon wafers measured by the MFCA method" |
| schema:author | Schönecker, Axel Georg |
| Stichting Energieonderzoek Centrum Nederland | |
| schema:contributor | Sinke, Willem Cornelis (1955-) |
| Eikelboom, Jacobus Anne (1955-) | |
|
schema:same |
<http:/ |
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schema:main |
<https:/ |
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http:/ |
"1995" |
| schema:about | zonnecellen |
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"en" |
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schema:is |
ECN |
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schema:number |
6 |
| schema:publication |
<https:/ |