Local carrier lifetime of non-passivated multi-crystalline silicon wafers measured by the MFCA method
type: ProductModel
type: CreativeWork
type: Book
issued: 1995
about: p145492346
author: p143638203
author: p075313502
contributor: p071641009
contributor: p087312646
language: en
is part of: p083728473
main entity of page: https://data.bibliotheken.nl/.well-known/genid/ef408e7ac8f6f923046662bdcee7ee0e
number of pages: 6
label: Local carrier lifetime of non-passivated multi-crystalline silicon wafers measured by the MFCA method / A. Schönecker, J.A. Eikelboom, W.C. Sinke