X-ray photogrammetry: basic geometry and quality
schema:publication →
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| schema:location | Amsterdam |
schema:publication →
Amsterdam; New York: Elsevier Pub. Co; 1970
| schema:name | "Amsterdam; New York: Elsevier Pub. Co; 1970" |
schema:publication →
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Elsevier Pub. Co |
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| schema:text | ill. |
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<http:/ |
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"Books"@en
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aat:300028051 |
schema:publication →
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schema:start |
"1970"^^schema:Date |
schema:publication :: schema:location →
Amsterdam
| schema:name | "Amsterdam" |
| "New York" |
schema:publication :: schema:publishedBy →
Elsevier Pub. Co
| schema:name | "Elsevier Pub. Co" |