Materials characterization
schema:subjectOf →
<n3c5babc5a6cd448d9cd21a9960f00d40b11>
| schema:text | Light microscopy -- X-ray diffraction methods -- Transmission electron microscopy -- Scanning electron microscopy -- Scanning probe microscopy -- X-ray spectroscopy for elemental analysis -- Electron spectroscopy for surface analysis -- Secondary ion mass spectrometry for surface analysis -- Vibrational spectroscopy for molecular analysis -- Thermal analysis. |
|
schema:additional |
aat:300195187 |
schema:about →
<n3c5babc5a6cd448d9cd21a9960f00d40b7>
|
schema:alternate |
"Werkstoffprüfung" |
schema:about →
<n3c5babc5a6cd448d9cd21a9960f00d40b9>
|
schema:alternate |
"Materials--Textbooks" |
schema:about →
<n3c5babc5a6cd448d9cd21a9960f00d40b2>
|
schema:alternate |
"Mikrostruktur" |
schema:about →
<n3c5babc5a6cd448d9cd21a9960f00d40b6>
|
schema:alternate |
"Materials--Analysis" |
schema:about →
<n3c5babc5a6cd448d9cd21a9960f00d40b1>
|
schema:alternate |
"Thermoanalyse" |
schema:about →
<n3c5babc5a6cd448d9cd21a9960f00d40b5>
|
schema:alternate |
"Materials" |
schema:identifier →
<n3c5babc5a6cd448d9cd21a9960f00d40b10>
|
schema:property |
"NL-AmRIJ" |
| schema:value | "288129" |
schema:about →
<n3c5babc5a6cd448d9cd21a9960f00d40b4>
|
schema:alternate |
"Spektroskopie" |
schema:about →
<n3c5babc5a6cd448d9cd21a9960f00d40b8>
|
schema:alternate |
"Materials--Analysis--Textbooks" |
schema:about →
<n3c5babc5a6cd448d9cd21a9960f00d40b3>
|
schema:alternate |
"Mikroskopie" |