schema:subjectOf
<n3c5babc5a6cd448d9cd21a9960f00d40b11>

schema:text Light microscopy -- X-ray diffraction methods -- Transmission electron microscopy -- Scanning electron microscopy -- Scanning probe microscopy -- X-ray spectroscopy for elemental analysis -- Electron spectroscopy for surface analysis -- Secondary ion mass spectrometry for surface analysis -- Vibrational spectroscopy for molecular analysis -- Thermal analysis.
schema:additionalType aat:300195187

schema:about
<n3c5babc5a6cd448d9cd21a9960f00d40b7>

schema:alternateName "Werkstoffprüfung"

schema:about
<n3c5babc5a6cd448d9cd21a9960f00d40b9>

schema:alternateName "Materials--Textbooks"

schema:about
<n3c5babc5a6cd448d9cd21a9960f00d40b2>

schema:alternateName "Mikrostruktur"

schema:about
<n3c5babc5a6cd448d9cd21a9960f00d40b6>

schema:alternateName "Materials--Analysis"

schema:about
<n3c5babc5a6cd448d9cd21a9960f00d40b1>

schema:alternateName "Thermoanalyse"

schema:about
<n3c5babc5a6cd448d9cd21a9960f00d40b5>

schema:alternateName "Materials"

schema:identifier
<n3c5babc5a6cd448d9cd21a9960f00d40b10>

schema:propertyID "NL-AmRIJ"
schema:value "288129"

schema:about
<n3c5babc5a6cd448d9cd21a9960f00d40b4>

schema:alternateName "Spektroskopie"

schema:about
<n3c5babc5a6cd448d9cd21a9960f00d40b8>

schema:alternateName "Materials--Analysis--Textbooks"

schema:about
<n3c5babc5a6cd448d9cd21a9960f00d40b3>

schema:alternateName "Mikroskopie"

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