schema:about
<ncc81ad7dd01741d493c3391b39fcf25fb1>

schema:alternateName "Microanalyse aux rayons X."

schema:about
<ncc81ad7dd01741d493c3391b39fcf25fb7>

schema:alternateName "Microscopie électronique à balayage"

schema:identifier
<ncc81ad7dd01741d493c3391b39fcf25fb8>

schema:propertyID "NL-AmRIJ"
schema:value "253171"

schema:about
<ncc81ad7dd01741d493c3391b39fcf25fb6>

schema:alternateName "Microscopie électronique à balayage"

schema:about
<ncc81ad7dd01741d493c3391b39fcf25fb5>

schema:alternateName "X-ray microanalysis"

schema:about
<ncc81ad7dd01741d493c3391b39fcf25fb4>

schema:alternateName "Microanalyse par émission X."

schema:about
<ncc81ad7dd01741d493c3391b39fcf25fb2>

schema:alternateName "Microscopes électroniques à balayage"

schema:about
<ncc81ad7dd01741d493c3391b39fcf25fb3>

schema:alternateName "Scanning electron microscopy"

Inverse relations

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