Scanning electron microscopy and X-ray microanalysis
schema:about →
<ncc81ad7dd01741d493c3391b39fcf25fb1>
|
schema:alternate |
"Microanalyse aux rayons X." |
schema:about →
<ncc81ad7dd01741d493c3391b39fcf25fb7>
|
schema:alternate |
"Microscopie électronique à balayage" |
schema:identifier →
<ncc81ad7dd01741d493c3391b39fcf25fb8>
|
schema:property |
"NL-AmRIJ" |
| schema:value | "253171" |
schema:about →
<ncc81ad7dd01741d493c3391b39fcf25fb6>
|
schema:alternate |
"Microscopie électronique à balayage" |
schema:about →
<ncc81ad7dd01741d493c3391b39fcf25fb5>
|
schema:alternate |
"X-ray microanalysis" |
schema:about →
<ncc81ad7dd01741d493c3391b39fcf25fb4>
|
schema:alternate |
"Microanalyse par émission X." |
schema:about →
<ncc81ad7dd01741d493c3391b39fcf25fb2>
|
schema:alternate |
"Microscopes électroniques à balayage" |
schema:about →
<ncc81ad7dd01741d493c3391b39fcf25fb3>
|
schema:alternate |
"Scanning electron microscopy" |