X-ray optics and X-ray microanalysis

<https://id.rijksmuseum.nl/300253156>

schema:CreativeWork
schema:name "X-ray optics and X-ray microanalysis"
schema:creator Pattee, Howard Hunt
schema:contributor Cosslett, Vernon Ellis
Engström, Arne
schema:about wetenschap
congresverslagen (vorm)
X-ray fluorescence analysis
microanalyse
schema:identifier <n70c8ffec6db14f18ab0d061fc581c3ffb1>
schema:inLanguage "eng"
schema:workExample X-ray optics and X-ray microanalysis: third international symposium, Stanford University, Stanford, California, August, 1962

schema:identifier →
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schema:propertyID "NL-AmRIJ"
schema:value "253156"

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[ .. ] → schema:exampleOfWork → X-ray optics and X-ray microanalysis

X-ray optics and X-ray microanalysis: third international symposium, Stanford University, Stanford, California, August, 1962schema:ProductModel
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