Statistical reliability

Advances in reliability / ed. by N. Balakrishnan, C.R. Raoschema:ProductModel Advances in safety and reliability : proceedings of the European Safety and Reliability Conference (ESREL 2005), Tri City (Gdynia - Sopot - Gdańsk), Poland, 27-30 June, 2005 / ed. by Krzysztof Kołowrockischema:ProductModel Confidence intervals for Cronbach's coefficient alpha values / Alex J. Koning, Philip Hans Fransesschema:ProductModel Confidence intervals for Cronbach's coefficient alpha values / Alex J. Koning, Philip Hans Fransesschema:ProductModel De productie van de WAO-instroomcijfers / auteurs: Jeroen S. Kerseboom, Jasper C. van den Brinkschema:ProductModel Introduction to probability models / Sheldon M. Rossschema:ProductModel Measurement error in comparative surveys / Daniel Leonard Oberskischema:ProductModel Optimal confidence intervals for the tail index and high quantiles / Ana Ferreira, Casper G. de Vriesschema:ProductModel Quality control and reliability / ed. by P.R. Krishnaiah, C.R. Raoschema:ProductModel Quantification of teaching behavior in physical education : a methodological study / Louis Willem Cornelis Tavecchioschema:ProductModel Quantification of teaching behavior in physical education : a methodological study / Louis Willem Cornelis Tavecchioschema:ProductModel Reliability and heterogeneity of railway services / Michiel J.C.M. Vromans, Rommert Dekker, Leo G. Kroonschema:ProductModel Reliability and rankings / Kar Yin Lamschema:ProductModel Schatten, hoe doe je dat? : uitspraken over groepen gebaseerd op gegevens over een (klein) deel van die groep, en de betrouwbaarheid van die uitspraken / Jan Smit en Wim Kremers ; [ill.: Ad van den Broek]schema:ProductModel Subjective probability distributions : a psychometric approach / Pieter Terlouwschema:ProductModel The accuracy of international economic observations / Peter A.G. van Bergeijkschema:ProductModel Vaardigheidscursus data-analyse : betrouwbaarheidsanalyse en het additieve schaalmodel / P.H.M. op de Weegh ... [et al.]schema:ProductModel

Biasskos:Concept