rdfs:label "Drost, Feike Cornelis (1959-)"
schema:name "Feike Cornelis Drost"
schema:familyName "Drost"
schema:givenName "Feike Cornelis"
schema:birthDate "1959"
schema:sameAs wd:Q102256443
<https://isni.org/isni/0000000084344783>
<http://viaf.org/viaf/23629410>
schema:mainEntityOfPage <https://data.bibliotheken.nl/.well-known/genid/58f44ec7f59b0ac056254955ee94f981>

Inverse relations

[ .. ] → schema:author → Drost, Feike Cornelis (1959-)

A note on Robinson's test of independence / by Feike C. Drost and Bas J.M. Werkerschema:ProductModel Adaptive estimation in time-series models / by Feike C. Drost, Chris A.J. Klaassen and Bas J.M. Werkerschema:ProductModel Adaptiveness in time series models / by Feike C. Drost, Chris A.J. Klaassen and Bas J.M. Werkerschema:ProductModel Asymptotics for generalized chi-square goodness-of-fit tests / door Feike Cornelis Drostschema:ProductModel Asymptotics for generalized chi-square goodness-of-fit tests / F.C. Drostschema:ProductModel Closing the Garch gap: continuous time Garch modeling / by Feike C. Drost and Bas J.M. Werkerschema:ProductModel Efficient estimation in semiparametric GARCH models / by Feike C. Drost and Chris A.J. Klaassenschema:ProductModel Efficient estimation in semiparametric GARCH models / by Feike C. Drost and Chris A.J. Klaassenschema:ProductModel Efficient estimation of autoregression parameters and innovation distributions for semiparametric integer-valued AR(p) models / by Feike C. Drost, Ramon van den Akker, Bas J.M. Werkerschema:ProductModel Estimating nuisance parameters in random-cell chi-square type goodness-of-fit tests / F.C. Drost, W.C.M. Kallenberg, J. Oosterhoffschema:ProductModel Estimation and testing in models containing both jumps and conditional heteroskedasticity / by Feike C. Drost, Theo E. Nijman and Bas J.M. Werkerschema:ProductModel Estimation and testing in models containing both jumps and conditional heteroskedasticity / by Feike C. Drost, Theo E. Nijman and Bas J.M. Werkerschema:ProductModel Generalized chi-square goodness-of-fit tests for location-scale models when the number of classes tends to infinity / by F.C. Drostschema:ProductModel How to define UMVU / F. C. Drostschema:ProductModel Semiparametric duration models / by Feike C. Drost and Bas J.M. Werkerschema:ProductModel Temporal aggregation of GARCH processes / by Feike C. Drost and Theo E. Nijmanschema:ProductModel Temporal aggregation of GARCH processes / by Feike C. Drost and Theo E. Nijmanschema:ProductModel