An artificial intelligence approach to test generation / by Narinder Singh

<http://data.bibliotheken.nl/id/nbt/p863846165>

rdfs:label	"An artificial intelligence approach to test generation / by Narinder Singh"
schema:name	"An artificial intelligence approach to test generation"
schema:author	Singh, Narinder (1956- ; kunstmatige intelligentie)
schema:sameAs	<http://www.worldcat.org/oclc/905462558>
schema:mainEntityOfPage	<https://data.bibliotheken.nl/.well-known/genid/d59c2e43652bf98b1bb902fd42420275>
http://purl.org/dc/terms#issued	"1987"
schema:about	Computersystemen
	kunstmatige intelligentie
	Micro-elektronica
	Testing
	Expertsystemen
	computersystemen
	<http://data.bibliotheken.nl/id/thes/p077604962>
schema:inLanguage	"en"
schema:isPartOf	The Kluwer international series in engineering and computer science
schema:isbn	"0898381851"
schema:numberOfPages	193
schema:publication	<https://data.bibliotheken.nl/.well-known/genid/8d632d72960e39d9fdeccbdc6bfd3b85>