Noble-gas ion bombardment on clean silicon surfaces : studied using ellipsometry and desorption / Antonius Hendricus Maria Holtslag

Auteursnaam op omslag: Toon Holtslag
rdfs:label "Noble-gas ion bombardment on clean silicon surfaces : studied using ellipsometry and desorption / Antonius Hendricus Maria Holtslag"
schema:name "Noble-gas ion bombardment on clean silicon surfaces : studied using ellipsometry and desorption"
schema:author Holtslag, Antonius Hendricus Maria (1955-)
schema:description "Auteursnaam op omslag: Toon Holtslag"
"Proefschrift T.H. Twente"
schema:sameAs <http://www.worldcat.org/oclc/64370821>
schema:mainEntityOfPage <https://data.bibliotheken.nl/.well-known/genid/23f54b8caa1288659df5fa2f6ea08891>
http://purl.org/dc/terms#issued "1986"
schema:about vaste-stoffysica
Rare gases
Silicon
Ionic implantation
Thermische desorptie
Ellipsometry
schema:inLanguage "en"
schema:numberOfPages 183
schema:publication <https://data.bibliotheken.nl/.well-known/genid/9c4fe3a87683cb0b2929328faf067dd2>