Hyperfine and ion beam interaction studies of Sn, Te, I and Sm impurities in silicon / Gerardus Johannes Kemerink

<http://data.bibliotheken.nl/id/nbt/p81153216X>

Proefschrift Groningen

rdfs:label	"Hyperfine and ion beam interaction studies of Sn, Te, I and Sm impurities in silicon / Gerardus Johannes Kemerink"
schema:name	"Hyperfine and ion beam interaction studies of Sn, Te, I and Sm impurities in silicon"
schema:author	Kemerink, Gerardus Johannes
schema:description	"Proefschrift Groningen"
schema:sameAs	<http://www.worldcat.org/oclc/63300375>
schema:mainEntityOfPage	<https://data.bibliotheken.nl/.well-known/genid/f419151f40d45ea942d6bbe15c215afd>
http://purl.org/dc/terms#issued	"1981"
schema:about	Tellurium
	Tin
	Silicon
	Samarium
	Ionic implantation
	theoretische natuurkunde
	Verontreinigingen
	Jodium
schema:inLanguage	"en"
schema:numberOfPages	231
schema:publication	<https://data.bibliotheken.nl/.well-known/genid/b543ef41b7ad616e7fde5435de0d233e>