An EPR and ENDOR study on defects in silicon / [by] Eric Gerard Sieverts
Proefschrift (W. en N.) Univ. van Amsterdam, G.U
| rdfs:label | "An EPR and ENDOR study on defects in silicon / [by] Eric Gerard Sieverts" |
| schema:name | "An EPR and ENDOR study on defects in silicon" |
| schema:author | Sieverts, Eric Gerard (1947-) |
| schema:description | "Proefschrift (W. en N.) Univ. van Amsterdam, G.U" |
|
schema:same |
<http:/ |
|
schema:main |
<https:/ |
|
http:/ |
"1978" |
| schema:about |
<http:/ |
| ENDOR | |
| Lattice defects | |
| Silicon | |
| Electron paramagnetic resonance | |
| Verontreinigingen | |
|
schema:in |
"en" |
|
schema:number |
144 |
| schema:publication |
<https:/ |