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rdfs:label
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"Spectroscopic analysis of erbium-doped silicon and ytterbium-doped indium phosphide / Ingrid Gersdorf"
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schema:name
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"Spectroscopic analysis of erbium-doped silicon and ytterbium-doped indium phosphide"
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schema:author
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Gersdorf, Ingrid
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schema:description
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"Proefschrift Universiteit van Amsterdam"
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schema:sameAs
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<http://www.worldcat.org/oclc/193920661>
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schema:mainEntityOfPage
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<https://data.bibliotheken.nl/.well-known/genid/b9eba4a0bef399e8947e63bbc397cd33>
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http://purl.org/dc/terms#issued
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"2001"
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schema:about
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Dopen (techniek)
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Indiumfosfide
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Ytterbium
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Erbium
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Silicon
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<http://data.bibliotheken.nl/id/thes/p080451756>
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schema:associatedMedia
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<http://dare.uva.nl/document/60743>
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schema:bookFormat
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schema:EBook
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schema:inLanguage
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"en"
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schema:isBasedOn
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Spectroscopic analysis of erbium-doped silicon and ytterbium-doped indium phosphide / Ingrid Gersdorf
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schema:isbn
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"9090147497"
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schema:numberOfPages
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126
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schema:publication
|
<https://data.bibliotheken.nl/.well-known/genid/5aeab8dd4ec0e7b6323ba975e600a6f6>
|