Developments in the use of failure rate data and reliability prediction methods for hardware / David J. Smith
Proefschrift Technische Universiteit Delft
| rdfs:label | "Developments in the use of failure rate data and reliability prediction methods for hardware / David J. Smith" |
| schema:name | "Developments in the use of failure rate data and reliability prediction methods for hardware" |
| schema:author | Smith, David John (1943- ; electrical engineering) |
| schema:description | "Proefschrift Technische Universiteit Delft" |
|
schema:same |
<http:/ |
|
schema:main |
<https:/ |
|
http:/ |
"2000" |
| schema:about | bedrijfszekerheid |
| foutentheorie | |
| computersimulatie | |
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schema:in |
"en" |
| schema:isbn | "0951656260" |
|
schema:number |
175 |
| schema:publication |
<https:/ |