A comparative study between light-biased MW-PCD and MFCA measurements on high-quality surface passivated silicon wafers / F.M. Schuurmans ... [et al.]
| rdfs:label | "A comparative study between light-biased MW-PCD and MFCA measurements on high-quality surface passivated silicon wafers / F.M. Schuurmans ... [et al.]" |
| schema:name | "A comparative study between light-biased MW-PCD and MFCA measurements on high-quality surface passivated silicon wafers" |
| schema:author | Stichting Energieonderzoek Centrum Nederland |
| schema:contributor | Schuurmans, Franciscus Marinus (1969-) |
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schema:same |
<http:/ |
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schema:main |
<https:/ |
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http:/ |
"1997" |
| schema:about | optische instrumenten en technieken |
| zonnecellen | |
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schema:in |
"en" |
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schema:is |
ECN |
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schema:number |
6 |
| schema:publication |
<https:/ |