Inverse relations
[ .. ] → schema:isPartOf → AmPS
Beam Optics of the AmPS Extraction Line / R. Hoekstraschema:ProductModel
Bunch length in Internal Target mode / R. Maasschema:ProductModel
Bundelafmetingen rondom Internal Target Area / R. Maasschema:ProductModel
Bundelexcursies tijdens extractie / R. Maasschema:ProductModel
Influence of RF-parameters on beam lifetime / F.B. Kroes and R. Maasschema:ProductModel
Injecting into AmPS when ring cavity operates at 476 MHz / R. Maasschema:ProductModel
Injection parameters and beam oscillations during extraction / R. Maasschema:ProductModel
Injektie-on axis/off-axis / R. Maasschema:ProductModel
Instability investigation for storage mode : microwave instability (single-bunch instability) / Y.Y. Wuschema:ProductModel
Local closed orbit bumps in AmPS / R. Maasschema:ProductModel
NIKHEF-K contributions to the 1989 particle accelerator conference Chicago, March 20-23, 1989 / [with contributions by] G. Luijckx ... [et al.]schema:ProductModel
NIKHEF-K contributions to the 3rd European Particle Accelerator Conference, Berlin, March 24-28, 1992 / [with contributions by] R. Maas ... [et al.]schema:ProductModel
Optimization of AmPS Chicane Magnets / R. Hoekstraschema:ProductModel
Required accuracy of tune measurement & parametrization of chromaticity control / R. Maasschema:ProductModel
Timing Injectiekickers / R. Maasschema:ProductModel
Tuning of AmPS / R. Maas and Y. Wuschema:ProductModel
Using the 16 viewscreens during commissioning of AmPS / R. Maasschema:ProductModel