Magnetic resonance study of zinc-related defects in silicon with optimized EPR spectrometer / Hans Eric Altink

<http://data.bibliotheken.nl/id/nbt/p102393540>

Proefschrift Universiteit van Amsterdam

rdfs:label	"Magnetic resonance study of zinc-related defects in silicon with optimized EPR spectrometer / Hans Eric Altink"
schema:name	"Magnetic resonance study of zinc-related defects in silicon with optimized EPR spectrometer"
schema:author	Altink, Hans Eric
schema:description	"Proefschrift Universiteit van Amsterdam"
schema:sameAs	<http://www.worldcat.org/oclc/65857212>
schema:mainEntityOfPage	<https://data.bibliotheken.nl/.well-known/genid/e006874c4d45c1e44ef88461bad01bc5>
http://purl.org/dc/terms#issued	"1993"
schema:about	<http://data.bibliotheken.nl/id/thes/p077595645>
	Verontreinigingen
	halfgeleiders
	Zink
	magnetische resonantie
	Silicon
	Electron paramagnetic resonance
	elektromagnetisme
schema:inLanguage	"en"
schema:numberOfPages	116
schema:publication	<https://data.bibliotheken.nl/.well-known/genid/2f3c98e91c0a18174fc24d084a0b051f>