@prefix dcterms1: <http://purl.org/dc/terms#> .
@prefix rdfs: <http://www.w3.org/2000/01/rdf-schema#> .
@prefix schema1: <http://schema.org/> .
@prefix xsd: <http://www.w3.org/2001/XMLSchema#> .

<http://data.bibliotheken.nl/id/nbt/p04359090X> a schema1:Book,
        schema1:CreativeWork,
        schema1:ProductModel ;
    rdfs:label "The possibilities and limitations of technology assessment : summary : in search of a useful approach / R.E.H.M. Smits, A.J.M. Leyten, J.L.A. Geurts" ;
    dcterms1:issued "1985" ;
    schema1:about <http://data.bibliotheken.nl/id/thes/p075664313> ;
    schema1:author <http://data.bibliotheken.nl/id/thes/p073174270>,
        <http://data.bibliotheken.nl/id/thes/p075288818> ;
    schema1:contributor <http://data.bibliotheken.nl/id/thes/p068524838>,
        <http://data.bibliotheken.nl/id/thes/p073174238> ;
    schema1:inLanguage "nl" ;
    schema1:mainEntityOfPage <https://data.bibliotheken.nl/.well-known/genid/a5aa8cd679b25cb5432dd57a635d60d9> ;
    schema1:name "The possibilities and limitations of technology assessment : summary : in search of a useful approach" ;
    schema1:numberOfPages 32 ;
    schema1:publication <https://data.bibliotheken.nl/.well-known/genid/385b1c26495abd1aba7212dafda427b5> ;
    schema1:sameAs <http://www.worldcat.org/oclc/64876330> .